Documentations : Nos publications

AdvEOTec intervient régulièrement sur des conférences internationales et publie de nombreux articles :

New Methodology for the Assessment of the Thermal Resistance of Laser Diodes and Light Emitting Diodes

D. Veyrié, O. Gilard, K. Sanchez, S. Lhuillier , F. Bourcier.
Microelectronics Reliability
Volume 50, Issue 4, April 2010, Pages 456-461 ; International Symposium on Reliability of Optoelectronics for Space (ISROS 11-14 May 2009)/ Advances in Wafer Level Packaging

Proton effects on low noise and high responsivity silicon-based photodiodes for space environment

G. Pedroza,O.Gilard, M-L. Bourqui, L. Bechou,Y. Deshayes, L.S.How, F.Rosala
JOURNAL OF APPLIED PHYSICS 105, 024513 _2009

Proton and gamma radiations effects on silicon photodiodes for space environments

G. Pedroza,O.Gilard, M-L. Bourqui, L. Bechou,Y. Deshayes, L.S.How, F.Rosala
ISROS, 11-14 May 2009 – Oral session

Mesure non-destructive de la résistance thermique des diodes lasers

Sébastien Lhuillier, Mémoire Ingénieur CNAM, 2009

Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications

M.L. Bourqui, L. Béchou, O. Gilard, Y. Deshayes, P. Del Vecchio, L.S. How, F. Rosala, Y. Ousten and A. Touboul
Microelectronics Reliability ; Volume 48, Issues 8-9, August-September 2008, Pages 1202-1207
19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2008)

35 GHz bandwidth Germanium-on-silicon photodetector

ROUVIÈRE M., VIVIEN L., LE ROUX X., MANGENEY J., CROZAT P., HOARAU C., MARRIS M., CASSAN E., PASCAL D., LAVAL S., FÉDÉLI J.-M., DAMLENCOURT J.-F., HARTMANN J.-M., KOLEV S.
2nd International Conference on Group IV Photonics, Antwerp (Belgique), 21-23 september 2005

High performance thermo-optic switches based on low loss acrylate polymers

L.W. Shacklette, P.M. Ferm, R. Blomquist, M. Maxfield, K. Killian, L.S. How Kee Chun
Optical Engineering 2003

40-Band integrated static gain flattening filter

S. Vallon, P. Chevallier, L. Guiziou, G. Alibert, L.S. How Kee Chun, N. Boos
IEEE Photonics Technology Letters, 2003, VOL 15; PART 4, pages 554-556

Low-Loss polymer thermo-optic switch : design and packaged performance

R. Blomquist, K. Killian, L. Guiziou, L.S. How Kee Chun, J.M. Jouanno, L. Shacklette, P. Ferm
Spie Photonics West, Jan 19-25, 2002

Using a negative capacitance to increase the tuning range of a varactor diode in MMIC technology

Kolev, S.; Delacressonniere, B.; Gautier, J.-L.;
Microwave Symposium Digest, 2001 IEEE MTT-S International , Volume: 3 , 20-25 May 2001
Page(s): 1581 -1584 vol.3

Using a negative capacitance to increase the tuning range of a varactor diode in MMIC technology

Kolev, S.; Delacressonniere, B.; Gautier, J.-L.;
Microwave Theory and Techniques, IEEE Transactions on , Volume: 49 Issue: 12 , Dec. 2001
Page(s): 2425 -2430

High-frequency performances of a partially depleted 0.18-µm SOI/CMOS technology at low supply voltage-influence of parasitic elements

Ferlet-Cavrois, V.; Marcandella, C.; Musseau, O.; Leray, J.L.; Pelloire, J.L.; Martin, F.; Kolev, S.; Pasquet, D.;
Electron Device Letters, IEEE , Volume: 19 Issue: 7 , July 1998
Page(s): 265 -267

Novel Microwave Negative Capacitance. Application to a Wide-Range Tunable Capacitance

S. Kolev, B. Delacressonière, J.L. Gautier
30rd European Microwave Conference, Paris, 2000

Conception et réalisation d'une capacité négative en technologie pHEMT monolithique. Application à une capacité accordable à large dynamique

S. Kolev, B. Delacressonière, J.L. Gautier
Journées Nationales Micro-Ondes, Poitiers 2001, paper 4D4

Conception de macrocomposants simulant des capacités accordables sur une grande dynamique en technologie monolithique

S. Kolev
Thèse de Doctorat, Université de Paris VI, Juillet 2000

Atomistic comparative study of VUV photodeposited silicon nitride on InP(100) by simulation and atomic force microscopy

J. Flicstein, E. Guillonneau, J. Marquez, L.S. How Kee Chun, D. Maisonneuve, C. David, Z. Wang, J.F. Palmier, J.L. Courant
Applied Surface Science, Vol. 154-155, 2000

Atomistic comparative study of VUV photodeposited silicon nitride on InP (100) by simulation and atomic force microscopy: discrete representation and topological analysis

J. Flicstein, E. Guillonneau, J. Marquez, L. S. How Kee Chun, D. Maisonneuve, C. David, Z.-Z. Wang, J. F. Palmier, J. L. Courant
Compututational Material Science 17,2-4, p525-p533, 2000

Phasar devices for WDM networks

Boos, N.; Beguin, A.; Beok, H.; Brun, M.; Fondeur, B.; Hiller, D.; Lerminiaux, C.; Lu, R.; Nicolas, C.; Rosala, F.; Ryszytiwskyj, W.
Nanostructures and Quantum Dots/WDM Components/VCSELs and Microcavaties/RF Photonics for CATV and HFC Systems, 1999 Digest of the LEOS Summer Topical Meetings , 1999, Page(s): II31 -II32

Modeling and Monte Carlo simulation of nucleation and growth of UV low temperature induced nanostructures

J. Flicstein, S. Pata, L.S. How Kee Chun, J.F. Palmier, J.L. Courant
Proc. SPIE, Vol. 3404, 1998

Passivation of InP-based HBTs for high bit rate circuit applications

D. Caffin, L. Bricard, J.L. Courant, L.S. How Kee Chun, B. Lescaut, A.M. Duchenois, M. Meghelli, J.L. Benchimol, P. Launay
Proc. IPRM, 1997

UV-deposited silicon nitride coupled with XeF2 surface cleaning for III-V optoelectronic device passivation

L.S. How Kee Chun, J.L. Courant, A. Falcou, P. Ossart, G. Post
Microelectronic Engineering, Vol. 36, 1997

Low-cost mirror substrates: manufacturing process evolution

Rosala, F.; Meyer, M.; Bes de Berc, J.-S.; Roussel, A.; Beriot, E.
Proceedings of the SPIE - Solid State Lasers for Application to Inertial Confinement Fusion: Second Annual International Conference - 1997 Vol. 3047 Page: 893-898

La passivation des composés III-V par dépôt photolytique direct de nitrure de silicium : Applications à la photodiode à avalanche à multi-puits quantiques

L.S. How Kee Chun
Thèse de Doctorat, Université de Paris XI, Avril 1997

Low cost mirror substrates; manufacturing process evolution

Rosala, F.; Meyer, M.; Bes de Berc, J.-S.; Roussel, A.; Beriot, E.
Proceedings of the SPIE - Specification, Production, and Testing of Optical Components and Systems - 1996 Vol. 2775 Page: 512-518